The Surface Science research group has three multi-technique ultra-high vacuum (UHV) systems located in Nanotalo.
Kratos Axis Ultra ESCA system
The system is an X-ray Photoemission Spectrometer (XPS, ESCA) enabling elemental concentrations,chemical state identification and chemical state mapping of the surface. The system contains a dual anode (Mg and Al Kα source) and a monochromated Al Kα source. The analysis area varies from 110 μm down to 15 μm, and he ultimate lateral resolution is 5 μm. There is also an He-source enabling Ultraviolet Photoemission Spectroscopy (UPS).
Ar Gas Cluster Ion Source (GCIS) capable of generating Ar cluster size up to 2000 atoms. The cluster source enables depth profiling of both hard and soft materials. The ion source also enables Low Energy Ion Scattering Spectrocopy (LEISS).
STM & XPS
The system is a self-combined collection consisting of
- Surface Science SSX-100 electron energy analyzer and monochromatic X-ray source
- Omicron VT SPM variable temperature scanning tunneling microscope
- SPECTALEED reverse view LEED-optics for low energy electron diffraction (LEED)
- evaporation systems for sample preparation in vacuum.
LEED & PM-IRRAS
This is another self-combined system consisting of
- Perkin Elmer PHI 3057 XPS system with a dual anode (Mg and Al Kα) X-ray source and an electron energy analyzer.
- Princeton Research Instruments reverse view LEED-optics
- Bruker Polarization Modulated Ifrared Absorption Spectroscopy (PM-IRRAS)